Tm doped crystals puag ntau yam ntxim nyiam uas xaiv lawv raws li cov khoom xaiv rau cov khoom siv hauv lub xeev laser nrog emission wavelength tunable nyob ib ncig ntawm 2um.Nws tau pom tias Tm:YAG laser tuaj yeem hloov kho los ntawm 1.91 txog 2.15um.Ib yam li ntawd, Tm: YAP laser tuaj yeem kho qhov sib txawv ntawm 1.85 txog 2.03 um.Lub quasi-peb theem ntawm Tm: doped crystals yuav tsum tsim nyog siv cov geometry thiab cov cua kub zoo los ntawm cov khoom siv hluav taws xob. Ntawm qhov tod tes, Tm doped cov ntaub ntawv tau txais txiaj ntsig los ntawm ib qho Lub neej ntev fluorescence, uas yog qhov txaus nyiam rau kev ua haujlwm siab Q-Hloov ua haujlwm.Kuj, kev sib tw ua haujlwm zoo nrog cov neeg nyob sib ze Tm3+ ions tsim ob excitation photons nyob rau theem siab laser rau ib lub twj tso kua mis photon.Qhov no ua rau lub laser zoo heev nrog quantum. efficiency nce mus txog ob thiab txo thermal loading.
Tm:YAG thiab Tm:YAP pom lawv daim ntawv thov hauv kev kho mob lasers, radars thiab atmospheric sensing.
Cov khoom ntawm Tm: YAP nyob ntawm cov muaju orientation.Crystals txiav raws 'a' lossis 'b' axis feem ntau yog siv.
Qhov zoo ntawm Tm:YAP Crysta:
Kev ua haujlwm siab dua ntawm 2μm ntau piv rau Tm: YAG
Linearly polarized tso zis beam
Kev nqus dav dav ntawm 4nm piv rau Tm:YAG
Siv tau ntau dua rau 795nm nrog AlGaAs diode dua li qhov adsorption ncov ntawm Tm:YAG ntawm 785nm
Basic Properties:
Space pawg | D162h (Pnma) |
Lattice tsis tu ncua (Å) | a=5.307,b=7.355,c=5.176 |
Melting point (℃) | 1850 ± 30 |
Melting point (℃) | 0.11 |
Thermal expansion (10-6· K-1) | 4.3//a, 10.8//b, 9.5//c |
Qhov ceev (g / cm-3) | 4.3//a, 10.8//b, 9.5//c |
Refractive Index | 1.943//a, 1.952//b, 1.929//cav 0.589 mm |
Hardness (Mohs nplai) | 8.5-9 |
Specifications:
Dopant kev xav | Tm: 0.2 ~ 15% |
Kev taw qhia | nyob rau hauv 5 ° |
“avefront distortion | <0.125A/inch@632.8nm |
7 od loj | txoj kab uas hla 2 ~ 10mm, Ntev 2 ~ 100mm Jpon thov ntawm cov neeg siv khoom |
Dimensional kam rau ua | Txoj kab uas hla + 0.00/-0.05mm, Ntev: ± 0.5mm |
Barrel tiav | Hauv av los yog polished |
Parallelism | ≤10″ |
Perpendicularity | ≤ 5′ |
Flatness | ≤λ/8@632.8nm |
nto zoo | L0-5 (MIL-0-13830B) |
Chamfer | 3.15 ± 0.05 hli |
AR Txheej Reflectivity | <0.25% |